The MCP houses a Thermo Scientific TF30 300 kV TEM that has 0.7 nm line and better than 0.2 nm point-to-point resolution. It is equipped with and Oxford light-element detector for quantitative X-ray analysis (EDX), scanning transmission electron microscope imaging with 0.17 nm resolution in both high-angle annular dark-field and bright field detectors. Added to this is an ASTAR scanning precession electron diffraction system can generate maps of crystal orientations down to 2 nm. The TF30 is also equipped with electron tomography holders and acquisition software. TEM holders available include double-tilt low-background holders for high-resolution TEM and EDX analysis, a heating and a liquid nitrogen cooled stage. A cryostage is available through the Integrated Imaging Center on campus.
Philips X’Pert PW 3040 Powder X-ray Diffractometer
Manufacturer & Model: Philips X’Pert PW 3040 Powder
XRD Data Collection Program: Panalytical Data Collector – version 4
XRD Data Analysis Program: MDI (Materials Data Inc.) Jade 9 for XRD
Capabilities and Options: Samples are mounted flat to slides or to zero background holders that provide little scattering for analysis. Often these samples are continuous materials with a flat exposed surfaces or they are materials that are crushed into fine powder for analysis.
Location: Maryland Hall 45 (basement level)
Contact information for training: Please contact Phil Chapman ([email protected]) in the Department of Materials Science and Engineering.
Reservations: iLab reservation system (Click Here).
Starting iLabs session:
