The MCP is home to the newly installed Bruker Advance D8 Powder X-ray Diffractometer (XRD). The D8 ADVANCE allows for simple execution of common XRPD methods including:

• Identification of both crystalline and amorphous phases and determination of specimen purity
• Quantitative analysis of both crystalline and amorphous phases in multi-phase mixtures
• Microstructure analysis (crystallite size, microstrain, disorder…)
• Bulk residual stress resulting from thermal treatment or machining in manufactured components
• Texture (preferred orientation) analysis

Additionally, the D8 is capable of characterizing thin films and coats with the following processes and capabilities:

• Grazing incidence diffraction
• X-Ray Reflectometry
• High-resolution X-ray diffraction
• Reciprocal space mapping

Location: Room G78A Stieff