Location: Room G73B Stieff

Manager: Ken Livi, [email protected]

Manufacturer: JEOL F200 200 kV TEM

Capabilities and Options: 0.7 nm line and better than 0.2 nm point-to-point resolution. 0.17 nm resolution in both high-angle annular dark-field and bright-filed detectors. Added to this is an ASTAR scanning precession electron diffraction and electron tomography.