JEOL F200 200 kV TEM
The MCP houses a JEOL F200 200 kV TEM that has 0.08 nm line and better than 0.2 nm point-to-point resolution. It is equipped with dual JEOL light-element detectors for quantitative X-ray analysis (EDX), scanning transmission electron microscope imaging with 0.14 nm resolution in both high-angle annular dark-field and bright field detectors. The F200 also has a Quantum Gatan Image Filter detector with a K2 electron detector for electron energy-loss spectroscopy (0.34 eV resolution). An IDES Luminary laser system is also available for illumination of samples with a laser. Added to all this is an ASTAR scanning precession electron diffraction system can generate maps of crystal orientations down to 2 nm. The F200 is also equipped with electron tomography holders and acquisition software. TEM holders available include double-tilt low-background holders for high-resolution TEM and EDX analysis, a heating and a liquid nitrogen cooled stage. A cryostage is available through the Integrated Imaging Center on campus.