This is a Perkin-Elmer X-ray photoelectron spectrometer (XPS) system for surface chemistry analysis. This surface-sensitive characterization technique allows elemental and chemical analysis in the first few nm’s of a sample. An ion gun is available on this system so that the first few nm’s of the surface can be removed, or chemistry can be analyzed as the surface layers are wiped away. Samples such as semiconductors, metals, ceramics, polymers, papers, and biomaterials are commonly analyzed using XPS. An additional option available on this system is an Ultraviolet Photoelectron Spectroscopy (UPS) unit that allows binding energies of valance electrons to be measured. This system requires extensive training for unassisted operation, but assisted operation can be easily arranged.
Contact
Mark Koontz
410-516-5335
[email protected]