This imaging instrument is equipped with dual X-ray source, and dual detector options for fast and high-resolution computed tomography of materials and biological systems. Detailed specifications and the characterization capabilities are below.

(a) Dual X-ray source

Nano focus:

  • X-ray source: 160 kV/16 W/200 μA
  • Resolution range of 0.4 to 4 μm

Micro focus:

  • X-ray source: 150 kV/75 W/500 μA
  • Resolution range of 5 to 50 μm

(b) Sample stage

  • Angular rotation,
  • Sample size up to 20 kgs
  • Mounts samples from sub-milli meters to few hundred milli meters.

(c) Imagers/detectors

Flat panel and CCD camera

  • Real-time imaging
  • Wide energy range
  • Fast acquisition, low noise
  • Pixel size: <10 μm (CCD), 100 μm (Flat panel)

Location: G74A Stieff

Manager: M Raju, [email protected]

Manufacturer: RX Solutions

*An SOP will be provided after training.

Contact

M Raju

M Raju

Xray Instruments AJA Orion Series Thin Film Dimension Icon with ScanAsyst (Bruker) Center Staff
Souleymane Diallo

Souleymane Diallo

Xray Instruments Leadership

Location: Olin Hall 142

Contact information for training: Please contact the MCP at [email protected].

Reservations: MCP iLab reservation system (Click Here).

Operating Instructions: RX-Solutions-MCT-Operating-Instructions (pdf)

Starting iLabs session:

iLabs-300x300-1