This is a benchtop XRD alternative (Malvern Panalytical Aeris) for phase identification, determination of crystallographic orientation, d-spacing between crystallographic planes, lattice constants, and crystal size. This system can be used to analyze samples with flat exposed surfaces, which includes particles dispersed onto slides, flat cut samples, and many others. Running samples is quick and easy and can take as little as 15 minutes to complete a scan of your samples. It is good to have, at least, an elemental knowledge of the sample composition for analysis. Analysis of the data is commonly completed with the HighScore Plus software that is available on the computer alongside the instrument. Regular users will be given a dosimeter ring for use. Hands-on user training is required for unassisted operation of this instrument.
Contact:
Alden Murphy
[email protected]