JEOL Grand ARM II 80-300kV Cold FEG (S)TEM – Cs beam corrected with Scanning Transmission Electron Microscopy (STEM) resolution better than 53 pm, dual EDX detectors for high throughput X-ray analysis and mapping, Gatan EELS Continuum K3 detector, Gatan One-View CMOS imaging camera, segmented STEM detector, and Direct Electron DE-16 direct electron device (DDD). These enable atomic-resolution High-Angle Annular Dark-Field, Bright-Field, 4D-STEM, and Optimum Bright Field imaging. Also on the ARM II:
- A JEOL-IDES Electrostatic Dose Modulator (EDM), a pre-sample electrostatic deflector, including electronics and software control. With EDM, the beam can switch on or off in less than 50 ns, and attenuate electron illumination, giving TEM and STEM users exceptional control over the dose (including temporal dose structuring and STEM synchronization).
- JEOL-IDES Luminary Micro: A Compact Specimen Photoexcitation System (CPXS) for JEOL TEMs. It is composed of a modulated laser, a compact optical delivery system (µODS), an inlet port, and a mirror. With this add-on, users can direct and focus the laser output onto the TEM sample in situ.
- Nanomegas Precession Electron Diffraction System with Topspin functionality for generating orientation, phase location, and strain mapping.
- Protochip Axon Dose and Data management
- Specialized Holders and Stages (compatible with both JEOL Microscopes):
- Gatan Single and Double Tilt Stages; Gatan heating holder;
- Gatan heating/straining holder;
- Hummingbird In Situ Biasing Holder with Keithley Voltage Source;
- Fischione FIB/TEM/LEAP Tomography Holder;
- A Keithley Model 3401-F Single-Channel Pulse/Pattern Generator;
- Protochips in situ liquid and gas holder;
- Liquid He Holder
Location: Room G73B Stieff
Manufacturer: JEOL F200 200 kV TEM
Capabilities and Options: 0.7 nm line and better than 0.2 nm point-to-point resolution. 0.17 nm resolution in both high-angle annular dark-field and bright-filed detectors. Added to this is an ASTAR scanning precession electron diffraction and electron tomography.*An SOP will be provided after training.
