JEOL F200 80-200kV Cold FEG (S)TEM

The MCP houses a JEOL F200 200 kV TEM that has 0.08 nm line and better than 0.2 nm point-to-point resolution. It is equipped with dual JEOL light-element detectors for quantitative X-ray analysis (EDX), scanning transmission electron microscope imaging with 0.14 nm resolution in both high-angle annular dark-field and bright field detectors. The F200 also has a Quantum Gatan Image Filter detector with a K2 electron detector for electron energy-loss spectroscopy (0.34 eV resolution). An IDES Luminary laser system is also available for illumination of samples with a laser. Added to all this is an ASTAR scanning precession electron diffraction system can generate maps of crystal orientations down to 2 nm. The F200 is also equipped with electron tomography holders and acquisition software. TEM holders available include double-tilt low-background holders for high-resolution TEM and EDX analysis, a heating and a liquid nitrogen cooled stage. A cryostage is available through the Integrated Imaging Center on campus.

• Dual EDX detectors for high throughput X-ray analysis and mapping
• Gatan K2-IS custom EELS system (Coupled with Gatan GIF Quantum Energy Filter);
• Gatan K3 direct detection camera for imaging
• NanoMEGAS Precession Electron Diffraction System with TopSpin;
• JEOL-IDES Luminary Micro: A Compact Specimen Photoexcitation System (CPXS) for JEOL TEMs. It is composed of a modulated laser, a compact optical delivery system (µODS), an inlet port, and a mirror. With this add-on, users can direct and focus the laser output onto the TEM sample in situ. With the Luminary Micro, users can study laser-induced phenomena in situ using fast cameras.
• Protochip Axon Dose and Data management
  • JEOL IT700 FEG SEM – A compact and user-friendly SEM equipped with SE, BSE, EDAX EDX and EDAX EBSD detectors, and a spatial resoultion of 1 nm.
  • The instrument is to get an internal laser system, for in-situ experiments with real-time characterization.