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Transmission Electron Microscopes

The MCP houses a Thermo Scientific TF30 300 kV TEM that has 0.7 nm line and better than 0.2 nm point-to-point resolution. It is equipped with and Oxford light-element detector for quantitative X-ray analysis (EDX), scanning transmission electron microscope imaging with 0.17 nm resolution in both high-angle annular dark-field and bright-filed detectors. Added to this is an ASTAR scanning precession electron diffraction system can generate maps of crystal orientations down to 2 nm. The TF30 is also equipped with electron tomography holders and acquisition software. TEM holders available include double-tilt low-background holders for high-resolution TEM and EDX analysis, a heating and a liquid nitrogen cooled stage. A cryostage is available through the Integrated Imaging Center on campus.

InfoTraining

Location: Olin Hall 141

Manufacturer: Thermo Scientific TF30 300 kV TEM

Capabilities and Options: 0.7 nm line and better than 0.2 nm point-to-point resolution. 0.17 nm resolution in both high-angle annular dark-field and bright-filed detectors. Added to this is an ASTAR scanning precession electron diffraction and electron tomography.

Location: Olin Hall 141

Contact information for training: Please contact Meg Tully in the Department of Materials Science and Engineering (mtully4@jhu.edu).

Reservations: MCP iLab reservation system (Click Here).

Starting iLabs session: