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Temperature and structure: Graph shows heat absorbed by a thin film of aluminum as its temperature increased. Inset boxes show electron diffraction patterns captured by DTEM as temperature changes. The patterns reveal the crystal structure and orientation of the aluminum. At low temperatures, pattern is characteristic of a face-centered-cubic crystal structure. When the sample is heated past the large melting peak, the spots disappear indicating that the aluminum has lost its crystal structure due to melting. Credit: NIST

Strengthening Thin-Film Bonds with Ultrafast Data Collection

October 21, 2014

When studying extremely fast reactions in ultrathin materials, two measurements are better than one. A new research tool invented by researchers at Lawrence Livermore National Laboratory (LLNL), Johns Hopkins University and the National Institute of Standards and Technology (NIST) captures information about both temperature and crystal structure during extremely fast reactions in thin-film materials.

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